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Convert your Tungsten (W) or LaB6 SEM into a Schottky Thermal Field Emission SEM with the
C>MORE Upgrade Kit

IMAGE OF TIN ON CARBON (15kV, x5000) OBTAINED FROM A C>MORE FEG
UPGRADE FITTED TO A JEOL JSM-6300 TUNGSTEN (W) SEM.

PERFORMANCE

SEM performance with Thermal Field Emission (TFE) capabilities is greatly improved. As a result a Schottky field emission source provides improved resolution with higher beam current, ability to image at low beam energy and longer source lifetime (typically 8,000hrs).

MAINTENANCE

The C>MORE upgrade package is low on maintenance and big on impact. Schottky field emitters have a longer lifespan than Tungsten (W) based cathodes and can last in excess of 8000 hours. With the C>MORE upgrade Schottky emitter exchange are straight-forward and simple.

COST

The C>MORE upgrade is a cost-effective solution, delivering high nano-analytical performance without the expense of a new instrument. The upgrade can be installed on-site with the support of a competent and experienced engineer and can also be provided by YPS.

The C>MORE conversion can be applied to various type of SEMs i.e. Tungsten, LaB6 and now Schottky Thermal Field Emission (please contact us to discuss specific benefits of C>MORE upgrade for SFEG type). A pre-assessment of the system to ensure good working condition of key aspects of the SEM is required.

Based on YPS's "pre-aligned" emitter module, replacement emitters are pre-aligned in our factory and a competent engineer can exchange the emitter without specialist expertise. All emitters are guaranteed for one year of normal operation.

For pricing enquiries, please contact us below.

Technical Features   Customer Benefits
Schottky field emission source   Improved resolution compared to Tungsten / LaB6 type cathodes
A wide range of electron Beam Current. From 10pA up to 100 nA (>100nA can be delivered on request)   Suitable for high resolution SE imaging and high beam current for WDS/EDS (with selected aperture at order)
Non-Destructive Imaging @ Low Voltage 1kV.   Suitable for radiation sensitive samples
TFE “Schottky” Source controlled from PC   Software control of Schottky source is independent of SEM system
Reduced Downtime and Cost of Ownership   Longer Source Lifetime (over Tungsten (W) and LaB6 . Trouble-free Tip exchange with Pre-Aligned™ YPS Schottky Field Emission Source
Excellent differential pumping   Small ion pump gives low vibration
External and internal magnetic shielding   Crisp imaging with no external interference
     

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Enquire About C>More

If you would like to learn more about C>MORE, please contact us:

York Probe Sources Ltd
Tel: +44(0)1904 799900
Fax: +44(0)1904 430434

Email: info@yps-ltd.com

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